• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    Device for the characterization of reflections in the thermal infrared spectrum. The present invention is a device (20) comprising a dome (1) which in turn comprises a structure of low emissivity and a plurality of infrared radiation sensors (2) that convert infrared radiation into temperature, a rigid base (11) linked to the dome (1), which on its lateral external part comprises a cylindrical band (13) of high emissivity and coded by signs (14) of low emissivity. Additionally, the device (20) comprises an angular positioning system (4) located inside the dome (1), and a control unit (5) linked with the angular positioning system (4) and with the sensors of infrared radiation (2) to characterize reflections in the thermal infrared spectrum. (Machine-translation by Google Translate, not legally binding)
    公开号:ES2669844A1
    申请号:ES201631520
    申请日:2016-11-28
    公开日:2018-05-29
    发明作者:Pablo RODRÍGUEZ GONZALVEZ；Jesús FERNANDEZ HERNÁNDEZ；Diego Gonzalez Aguilera；Manuel RODRÍGUEZ MARTÍN
    申请人:Universidad de Salamanca；
    IPC主号:
    专利说明:

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    the system within the thermographic scene in a non-invasive way, since it does not require contact with the object of study to provide results and is safe, since it is passive and does not emit dangerous radiation to users.
    Finally, this device has portability and autonomy given its reduced weight and its battery, which allows it to be used both indoors and outdoors, without reducing its range, since several can work together. DESCRIPTION OF THE DRAWINGS
    To complement the description that is being made and in order to help a better understanding of the characteristics of the invention, according to a preferred example of practical implementation thereof, a set of drawings is attached as an integral part of said description. where, for illustrative and non-limiting purposes, the following has been represented:
    Figure 1.- Shows a front view of the preferred embodiment of the invention.
    Figure 2.- Shows a top view of the preferred embodiment of the invention.
    Figure 3.- Shows a vertical sectional view of the preferred embodiment of the invention.
    Figure 4.- Shows a rigid support top view of the preferred embodiment of the invention.
    Figure 5.- Shows a top view of a preferred embodiment of the invention. PREFERRED EMBODIMENT OF THE INVENTION
    The present invention is a device (20) for the characterization and elimination of reflections in the thermal infrared spectrum, comprising, as shown in Figure 1, a dome (1) which in turn comprises a spatial structure type “Geodesic dome” of frequency 2 whose surface is covered with a low material
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    positioned in five equi-angularly distant locations around the cylindrical band (13), where each element comprises a metal body of low emissivity, to facilitate its detection and identification by contrast with respect to the band (13). The number of elements and their arrangement allows at least 2 of them to be located from any point of view, which, together with the arrangement generated by the positioning signals of the system itself (4), allows obtaining, by comparison of both data sources (scene positioning and system positioning signals), the actual amount of the dome's own turn (1) (or turn relative to its axis) and thus be able to accurately locate the relative position of the dome (1 ) with respect to the sensor
    10 thermographic that captures the scene.
    In this way and thanks to the hemispherical geometry of the dome, the positioning band (13) and the angular positioning system (4), the device (20) can be angularly referenced the vector associated with spurious reflection passively.
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    权利要求:
    Claims (1)
    [1]
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    同族专利:
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    ES2669844B1|2019-03-14|
    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    US20090294674A1|2005-04-06|2009-12-03|Guillaume Bathelet|Method and Device for Eliminating Parasite Reflections During Inspection of Translucent or Transparent Hollow Objects|
    WO2010089627A1|2009-02-05|2010-08-12|Flir Systems, Inc.|A fast spectral method to measure emissivity in a partially-controlled environment using a focal plane array infrared camera|
    US9066028B1|2010-01-08|2015-06-23|The United States Of America As Represented By The Administator Of The National Aeronautics And Space Administration|Methods and systems for measurement and estimation of normalized contrast in infrared thermography|
    EP2627979A1|2010-10-14|2013-08-21|Semi-Conductor Devices - An Elbit Systems - Rafael Partnership|Dewar assembly for ir detection systems|
    US20130093883A1|2011-10-14|2013-04-18|Microsoft Corporation|Obtaining Spatially Varying Bidirectional Reflectance Distribution Function|
    US20160292826A1|2015-04-05|2016-10-06|Hema Imaging Llc|Systems and Approaches for Thermal Image Corrections|
    法律状态:
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    优先权:
    申请号 | 申请日 | 专利标题
    ES201631520A|ES2669844B1|2016-11-28|2016-11-28|DEVICE FOR THE CHARACTERIZATION OF REFLECTIONS IN THE THERMAL INFRARED SPECTRUM|ES201631520A| ES2669844B1|2016-11-28|2016-11-28|DEVICE FOR THE CHARACTERIZATION OF REFLECTIONS IN THE THERMAL INFRARED SPECTRUM|
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